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Untitled Document
TESTING
Testing the Chips
Each
chip is tested to assess functionality and to see how fast it can store or retrieve
information. Chip speed (or access time) is measured in nanoseconds (a billionth,
1/1,000,000,000th of a second). The precision demands are so great that as many
as half the chips are found to be defective. A drop of ink is deposited on defective
chips.
Burning In
This
burn-in oven runs performance tests on every chip simulating actual usage conditions.
Each chip is tested by feeding information to the chip and querying for the
information to ensure the chip is receiving, storing, and sending the correct
data.
Scanning
All chips are scanned, using optics or lasers, to discover any bent, missing,
or incorrectly formed leads.